The surface profiles of eight aluminum discs were scanned after each sample was buffed with an electric buffer. This experiment seeks to determine whether or not a buffer is an effective instrument for creating a smooth surface at the microscopic level. The samples were buffed with three buffing wheels of the following grit in sequential order: 120, 180, and 240. They were then scanned using a stylus profilometer in two perpendicular paths. The resulting profile graphs displayed a wide range of surface roughness among the samples, with only one of the samples meeting the defined criteria of a microscopically smooth surface. Therefore, additional methods must be sought out for accomplishing this task.
Mechanical Engineering and Material Sciences Independent Study
Date of Submission
Hawa, Angelo and Weisensee, Patricia, "Specimen Preparation and Surface Analysis" (2020). Mechanical Engineering and Materials Science Independent Study. 117.