Abstract
The surface profiles of eight aluminum discs were scanned after each sample was buffed with an electric buffer. This experiment seeks to determine whether or not a buffer is an effective instrument for creating a smooth surface at the microscopic level. The samples were buffed with three buffing wheels of the following grit in sequential order: 120, 180, and 240. They were then scanned using a stylus profilometer in two perpendicular paths. The resulting profile graphs displayed a wide range of surface roughness among the samples, with only one of the samples meeting the defined criteria of a microscopically smooth surface. Therefore, additional methods must be sought out for accomplishing this task.
Document Type
Final Report
Class Name
Mechanical Engineering and Material Sciences Independent Study
Date of Submission
4-25-2020
Recommended Citation
Hawa, Angelo and Weisensee, Patricia, "Specimen Preparation and Surface Analysis" (2020). Mechanical Engineering and Materials Science Independent Study. 117.
https://openscholarship.wustl.edu/mems500/117